Features and Benefits • New test method development offers easier, more user-friendly protocol scripting • Enhanced imaging capabilities, including profi le cross-sectional imaging, real-time adjustment of scanning parameters, plane-fi t leveling, and more • Survey scanning option allows scanning of areas up to 500 µm x 500 µm • Experiment data analysis using the most powerful, comprehensive software • Support of small force / small displacement measurements, from MEMS testing to tensile experiments, surface topology, polymers, and more • Simulation mode enables offl ine sample setup, sample runs, method writing, and data analysis • Integrated 2D plotting tool with easy-to-read statistical analysis • Analyst software assists data analysis, software updates provide the latest improvements, and System Agent enables automatic software reporting