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之静电放电防护...............................................................................1 ESD (Electrostatic Discharge) Protection in CMOS Integrated Circuits ..........................1 目录..........................................................................................................................................2 第一章 简介 (Introduction) ....................................................................................................4 第二章 静电放电的模式以及工业测试标准.........................................................................6 2.1 人体放电模式 (Human-Body Model, HBM) :.........................................................6 2.2 机器放电模式 (Machine Model, MM).....................................................................8 2.3 组件充电模式 (Charged-Device Model, CDM).......................................................9 2.4 电场感应模式(Field-Induced Model, FIM) ............................................................12 第三章 静电放电的测试.......................................................................................................13 3.1 静电放电测试组合..................................................................................................13 3.2 静电放电测试方式..................................................................................................16 3.3 静电放电故障判断..................................................................................................17 3.4 静电放电测试结果的判读......................................................................................18 第四章 静电放电防护设计之基本概念...............................................................................20 4.1 防护威廉希尔官方网站 之设计概念..............................................................................................20 4.2 防护组件之选用......................................................................................................22 4.3 静电放电防护威廉希尔官方网站 的实例......................................................................................23 第五章 传输线触波产生器系统(TLPG System) .................................................................26 5.1 前言..........................................................................................................................26 5.2 传输线触波原理......................................................................................................28 5.3 传输线触波产生器(TLPG)的组装.........................................................................32 5.4 传输线触波产生器的应用......................................................................................38 5.5 TLPG 的组装实例....................................................................................................40 第六章 互补式金氧半集成威廉希尔官方网站 之静电放电防护技术.......................................................43 6.1 前言..........................................................................................................................43 6.2 制程上(Process Level)的改进方法.........................................................................45 6.3 组件上(Device Level)的改进方法..........................................................................49 6.3.1 LVTSCR 组件........................................................................................................49 6.3.2 互补式LVTSCR 组件的设计..............................................................................52 6.3.3 高噪声免疫力的LVTSCR 组件..........................................................................57 6.4 威廉希尔官方网站 上(Circuit Level)的改进方法..........................................................................65 第七章 全芯片防护设计.......................................................................................................77 7.1 内部异常损伤的问题...............................................................................................77 7.2 VDD 与VSS 间的ESD 防护..................................................................................82 7.3 先进制程对ESD 拑制威廉希尔官方网站 的影响........................................................................89 7.4 节省面积的创新设计..............................................................................................92 7.5 在Mixed-Mode IC 的应用......................................................................................99 7.6 结论.......................................................................................................................104 第八章 静电放电防护设计之案例探讨.............................................................................105 8.1 组件充电模式之防护设计 (CDM ESD Protection) ...........................................105 ESD Protection in CMOS Integrated Circuits 第 3 页 共 127 页 8.2 动态浮接闸级之ESD 防护技术.......................................................................... 111 第九章 静电放电防护技术相关之美国专利与研究论文 US Patents and Research Papers on the ESD Protection Techniques........................................................................................122 9.1 ESD 相关之美国专利............................................................................................122 9.2 ESD 相关之研究论文............................................................................................122 第十章 结 论.......................................................................................................................123 REFERENCES.....................................................................................................................124 ESD Links............................................................................................................................126 |
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