怎么将从非IC-CAP环境测量的数据导入IC-CAP？

我在IC-CAP 2013的文档中读到，可以将从非IC-CAP环境测量的数据导入到IC-CAP中，但是，我真的不能直截了当地说明这是如何完成的（应该提到我
我是IC-CAP的新手。
我有一个GaN HEMT晶体管的DC-IV，多偏置S参数和CW RF（NVNA数据）测量我想做一个模型;
至于现在，我使用ADS中的测量数据制作了自己的模型。
我对准确性并不完全满意，并希望看看我是否可以使用IC-CAP中的一个提取包做得更好。
由于我已经拥有测量数据，我认为最有效的时间用途是重复使用这些数据，我今天也通过DAC工具在ADS中使用这些数据。
但是如何将这些数据整合到IC-CAP中呢？
据我了解，ADS无法将数据导出为* .mdm格式;
是否有可能以某种方式从ADS生成的数据集文件中读取数据？
或者可以用于此目的的任何其他脚本？
问候，d。



     以下为原文

  I read in the documentation of IC-CAP 2013 that it's possible to import data measured from a non-IC-CAP environment into IC-CAP, however, I can't really say it's intuitive how this is done (should be mentioned that I'm new to IC-CAP). I have DC-IV, multi-bias S-parameter, and CW RF (NVNA data) measurements of a GaN HEMT transistor I'd like to make a model of; as for now I've made my own model using the measured data in ADS. I'm not fully satisfied with the accuracy, and would like to see if I can do any better using one of the extraction packages in IC-CAP.  

Since I already have the measurement data, I think the most effective use of time is to re-use this data, which I per today also use in ADS via the DAC-tool. But how can I incorporate this data into IC-CAP? As far as I understand, ADS can't export data to the *.mdm format; is it possible to somehow read data from the data set files that ADS generates? Or any other script one can use for this purpose?

Regards,
d.