嗨Calvin，感谢您对IEEE 1149.6关于交流耦合差分线路的良好质疑，该线路采用串联电容。
串联电容的测试是1149.6测试覆盖率的重要部分。
IEEE 1149.6标准支持丢失/开路以及短路电容，但并非所有应用都支持短路电容，如IEEE 1149.6标准中的概述。
您可以从IEEE网站下载IEEE 1149.6标准的pdf副本：http：//ieeexplore.ieee.org/更多信息可以在1149.6网站找到：http：//grouper.ieee.org/groups/1149/
6 / index.html Agilent Medalist i3070软件版本07.10p及更高版本支持IEEE 1149.6，它将捕获丢失的电容以及其他故障，包括短路/开路差分线路，1149.6互连测试期间短路差分线路连接至GND或VCC。
Agilent Medalist i3070软件版本07.20p还包括1149.6的短路电容器覆盖率，这是任何支持IEEE 1149.6的系统中的第一个。
请注意，测试1149.6应完全符合IEEE 1149.6标准，以便能够测试上述覆盖范围。
RegardsJun
以上来自于谷歌翻译
以下为原文
Hi Calvin,
Thanks for your good question about the IEEE 1149.6 coverage on AC coupled differential lines which use a series capacitance in the line. Testing of the series capacitor is an important part of the 1149.6 test coverage. The IEEE 1149.6 standard support missing/open as well as shorted capacitor however not all application support shorted capacitor as outline in the IEEE 1149.6 standard.
You can download the pdf copy of the IEEE 1149.6 standard from the IEEE website:
http://ieeexplore.ieee.org/
More information can be found at the 1149.6 site:
http://grouper.ieee.org/groups/1149/6/index.html
Agilent Medalist i3070 software revision 07.10p and above support IEEE 1149.6 which will capture missing capacitor along with other failure which includes shorted/open differential line, shorted differential line to GND or VCC during the 1149.6 interconnect test. The Agilent Medalist i3070 software revision 07.20p also included shorted capacitor coverage for 1149.6 which is the first in any system that supports IEEE 1149.6. Take note that testing 1149.6 should fully comply to the IEEE 1149.6 standard in able to test the coverage mentioned above.
Regards
Jun
嗨Calvin，感谢您对IEEE 1149.6关于交流耦合差分线路的良好质疑，该线路采用串联电容。
串联电容的测试是1149.6测试覆盖率的重要部分。
IEEE 1149.6标准支持丢失/开路以及短路电容，但并非所有应用都支持短路电容，如IEEE 1149.6标准中的概述。
您可以从IEEE网站下载IEEE 1149.6标准的pdf副本：http：//ieeexplore.ieee.org/更多信息可以在1149.6网站找到：http：//grouper.ieee.org/groups/1149/
6 / index.html Agilent Medalist i3070软件版本07.10p及更高版本支持IEEE 1149.6，它将捕获丢失的电容以及其他故障，包括短路/开路差分线路，1149.6互连测试期间短路差分线路连接至GND或VCC。
Agilent Medalist i3070软件版本07.20p还包括1149.6的短路电容器覆盖率，这是任何支持IEEE 1149.6的系统中的第一个。
请注意，测试1149.6应完全符合IEEE 1149.6标准，以便能够测试上述覆盖范围。
RegardsJun
以上来自于谷歌翻译
以下为原文
Hi Calvin,
Thanks for your good question about the IEEE 1149.6 coverage on AC coupled differential lines which use a series capacitance in the line. Testing of the series capacitor is an important part of the 1149.6 test coverage. The IEEE 1149.6 standard support missing/open as well as shorted capacitor however not all application support shorted capacitor as outline in the IEEE 1149.6 standard.
You can download the pdf copy of the IEEE 1149.6 standard from the IEEE website:
http://ieeexplore.ieee.org/
More information can be found at the 1149.6 site:
http://grouper.ieee.org/groups/1149/6/index.html
Agilent Medalist i3070 software revision 07.10p and above support IEEE 1149.6 which will capture missing capacitor along with other failure which includes shorted/open differential line, shorted differential line to GND or VCC during the 1149.6 interconnect test. The Agilent Medalist i3070 software revision 07.20p also included shorted capacitor coverage for 1149.6 which is the first in any system that supports IEEE 1149.6. Take note that testing 1149.6 should fully comply to the IEEE 1149.6 standard in able to test the coverage mentioned above.
Regards
Jun
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