清华大学芯片测试讲义pdf

Outline:
1. Fundamentals on Testing and Design for Testability
2. Combinational Test Generation
3. Fault Simulation
4. Sequential Test Generation
5. Memory Testing
6. Testability Measure
7. Design for Testability
8. Boundary Scan
9. Built-In Self-Test
10. IDDQ Testing

清华大学芯片测试讲义pdf